Presentations

Socket Testing

	Lumped and Distributed Equivalent Circuits for Test Sockets
	Presented at BiTS Workshop 2006
	• Demonstrate uses and limits of different equivalent circuit model • Place socket properties into application perspective • Interpret the significance of parameters and their variations depending on the environment a socket is placed in

	Socket Life Cycle RF Testing
	Presented at BiTS Workshop 2007
	• Examines RF contact performance after mechanical cycling; the results are surprising • Variations in RF performance throughout a test regimen of 1 million cycles with a significant number of sockets tested were explored

	Tolerance Induced Test Socket RF Performance Variation
	Presented at BiTS Workshop 2008
	• About the impact of misalignment on capacitance, inductance and other performance parameters • Examples show potentially significant impact of placement accuracy on high speed performance • Socket designs can be optimized for minimal performance change via sensitivity analysis

	Contactor Resistance Vs. Z-OD: Photo Finger™ (Winner - Best Data Presentation)
	Presented at Southwest Test Workshop 2001
	• A few graphs contributed to a team effort • Contactor resistance, force and RF performance

	Probe Card Characterization in Time and Frequency Domain
	Presented at Southwest Test Workshop 2007
	• A look at time domain vs. frequency domain probecard RF testing with some examples about strengths and weaknesses of either

	Effect of Ground Return Path on Timing Accuracy
	Presented at Southwest Test Workshop 2008
	• Problem of ground return path with reference to timing explored • Significant contributions to timing identified and examined other than line length matching, fabrication variability, coupled sections and transitions