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Test Socket Development Assistance
Interface Optimization
Probe Card Design Assistance
Time & Frequency Domain Modeling & Measurement
Signal Path Integrity Engineering
Signal Integrity Assessment
Subsystem Component Characterization
Test Socket Characterization
Probe Card Characterization
High Performance Custom Probes
Semi-flexible Probes
Low Impedance Probes
Small Pitch, Low Force Probes
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Presentations
Workshops
Conferences
Professional Affiliations
MEMS Design Assistance
Contact Design Assistance
Finite Element Analysis
RF Model Development
Socket & Probe Card Performance Assessment


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